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MarSurf M 400 | Mobile Roughness Measuring Instrument
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FEATURES :

MarSurf M 400. The best of the “mobiles”
  • Surface evaluation using skidless tracing is not only needed in the measuring room but is required more and more in production as well.
  • This usually means higher demands on operator qualities, more time, more adjustment work.
  • In the line of “mobile surface metrology”, MarSurf M 400 offers this required scope of performance and at the same time simple and fast operability.
  • Mobile and stationary measuring instrument
  • Roughness and waviness measurements
  • Traversing lengths up to 26 mm
  • Over 50 R , W and P surface parameters
  • Automatic choice of cut-off and traversing length in accordance with international standards
  • Dynamic calibration function
  • Cable and Bluetooth connection between drive unit and evaluation instrument (4 m) (MarSurf M 400 C is only with cable connection)
  • Magnetic probe holder (break away probe) BFW 250
  • Motorized probe zero setting (max. 7.5 mm)

    • Supplied with :

  • MarSurf M 400 evaluation instrument
  • MarSurf SD 26 drive unit including BFW 250 probe system
  • Standard probe arm (6852403)
  • 1 roll of thermal paper
  • Wide-range power supply unit with 3 adapters
  • 2 USB cables (for connecting to the PC and the M 400)
  • Operating instructions
  • Case

    • APPLICATIONS :
    Machine building

    • Bearings, shafts, racks, valves

    Automotive industry

    • Steering, brake system, gearbox, crankshaft, camshaft, cylinder head, cylinder block, turbocharger

    Steel industry

    • Measurement of sheet metal surfaces
    • Measurement of roller surface

    Medicine

    • Surface roughness measurement for hip and knee endoprostheses

    Aerospace

    • Turbine components

    ACCESSORIES :
    Measuring stand

    • ST-D, ST-F and ST-G
    • Holder on measuring stand

    Other accessories

    • CT 120 XY table, parallel vise, V-block
    • Assorted probe arms for the BFW probe system

      Technical Data
      M 400
      Measuring principleStylus method
      ProbeBFW skidless system
      Measuring range+/– 250 μm (up to +/– 750 μm with 3x probe arm length)
      Profile resolutionMeasuring range +/– 250 μm: 8 nm
      Measuring range +/– 25 μm: 0.8 nm
      Filter according to ISO/JISGaussian filter as per ISO 11562
      Filter as per ISO 13565
      Cutoff Ic according to ISO/JIS0.25 mm, 0.8 mm, 2.5 mm, automatic, variable
      Number n of sampling length according to ISO/JIS1– 5
      Contacting speeds0.2 mm/s; 1.0 mm/s
      Measuring force0.75 mN
      Surface parametersOver 50 surface parameters for R, P and W profiles according to current ISO/JIS or
      MOTIF standards (ISO 12085)