MarSurf CP select | 3D Profilometry
DESCRIPTION :
- Optical 2D / 3D profilometry
- The compact MarSurf CP and the MarSurf CL select are optical profilometers for the three dimensional measurement and analysis of surfaces – non-tactile, independent of material and fast.
- They are characterized by an extremely fast detection of large measuring surfaces with simultaneously high measuring precision.
- Thanks to their modular design, the measuring systems can be adapted to different measuring tasks and individual requirements for automation, measuring comfort and accuracy. Depending on the measuring task, various sensors can be flexibly selected. Axis systems as well as software modules can be combined individually.
- The MarSurf CP and CL select meet your individual requirements for automation, measuring comfort and accuracy - right up to the fully automated measuring solution.
- Large-scale 3D measurement
- Very high measuring speed
- User-independent serial measurements by automation software
- Excellent flank acceptance
- Layer thickness measurement and measurement of transparent materials
- Large height measuring range with large working distance
- Robust and reliable
- User-friendly concept
- The established optical measuring system is successfully used, for example, for:
- Roughness measurement according to DIN EN ISO 4287
- Topography measurement (including volume, wear, isotropy)
- Measurement of macro and microgeometries
- Determination of flatness and coplanarity
- Users value the MarSurf CP and CL select series as reliable measuring systems that provide quantitative traceable 3D characteristics for many industries.
Supplied with: MarSurf CP select
- Chromatic point sensors selectable
- Portal construction including control electronics, model selectable
- Motorized XYZ table selectable in different variants
- Industrial computer incl. two 24“ TFT monitors
- Vibration damping selectable
- Overview camera selectable
- MarSurf MSW for intuitive data acquisition
- MarSurf ASW for automation (optional)
- MarSurf MfM for professional evaluation, graphic presentation and creation of measuring records
- (Standard, Extended, Premium version selectable)
- MarSurf CL select
- Chromatic line sensors selectable
- Portal construction including control electronics, model selectable
- Motorized XYZ table selectable in different variants
- Industrial computer incl. two 24“ TFT monitors
- Vibration damping selectable
- Overview camera selectable
- MarSurf MSW for intuitive data acquisition
- MarSurf ASW for automation (optional)
- MarSurf MfM for professional evaluation, graphic presentation and creation of measuring records (Standard, Extended, Premium version selectable)
APPLICATIONS :
Mechanical Engineering
- To qualify and quantify roughness, geometry and wear volume
Electronics and semiconductors
- Component inspection down to the sub-micrometer range for defect-free products
Medical Technology
- Quality assurance of medical surfaces in production and laboratory
Material Science
- Optimization of functional properties of new surfaces and products
Microsystems Technology
- Measure complex surface geometries of smallest components with nanometer precision
Technical Data
| CP Select | |
|---|---|
| Measuring principle | Chromatic-confocal |